| IONSIMS (Vol. 3): Ion Implanted Depth Distributions Measured Using Secondary Ion Mass Spectrometry Contributor(s): Wilson, R. G. (Author), Zavada, J. M. (Author) |
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ISBN: 1478789158 ISBN-13: 9781478789154 Publisher: Outskirts Press OUR PRICE: $81.56 Product Type: Paperback Published: June 2017 * Not available - Not in print at this time * |
| Additional Information |
| BISAC Categories: - Science | Physics - Atomic & Molecular - Technology & Engineering | Electronics - Semiconductors |
| Physical Information: 2.07" H x 8.5" W x 11.02" (5.15 lbs) 760 pages |