IONSIMS (Vol. 4): Ion Implanted Depth Distributions Measured Using Secondary Ion Mass Spectrometry Contributor(s): Wilson, R. G. (Author), Zavada, J. M. (Author) |
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ISBN: 1478789166 ISBN-13: 9781478789161 Publisher: Outskirts Press OUR PRICE: $93.46 Product Type: Paperback Published: June 2017 * Not available - Not in print at this time * |
Additional Information |
BISAC Categories: - Science | Physics - Atomic & Molecular - Technology & Engineering | Electronics - Semiconductors |
Physical Information: 2.43" H x 8.5" W x 11.02" (6.04 lbs) 894 pages |