X-Ray Diffraction Imaging: Technology and Applications Contributor(s): Greenberg, Joel (Editor) |
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ISBN: 1498783619 ISBN-13: 9781498783613 Publisher: CRC Press OUR PRICE: $180.50 Product Type: Hardcover - Other Formats Published: November 2018 |
Additional Information |
BISAC Categories: - Technology & Engineering | Electronics - Circuits - General - Technology & Engineering | Lasers & Photonics - Technology & Engineering | Biomedical |
Dewey: 620.112 |
LCCN: 2018027858 |
Series: Devices, Circuits, and Systems |
Physical Information: 256 pages |
Descriptions, Reviews, Etc. |
Publisher Description: This book explores novel methods for implementing X-ray diffraction technology as an imaging modality, which have been made possible through recent breakthroughs in detector technology, computational power, and data processing algorithms. The ability to perform fast, spatially-resolved X-ray diffraction throughout the volume of a sample opens up entirely new possibilities in areas such as material analysis, cancer diagnosis, and explosive detection, thus offering the potential to revolutionize the fields of medical, security, and industrial imaging and detection. Featuring chapters written by an international selection of authors from both academia and industry, the book provides a comprehensive discussion of the underlying physics, architectures, and applications of X-ray diffraction imaging that is accessible and relevant to neophytes and experts alike.
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