| Image Analysis and Recognition: International Conference Iciar 2004, Porto, Portugal, September 29 - October 1, 2004, Proceedings, Part I 2004 Edition Contributor(s): Campilho, Aurélio (Editor), Kamel, Mohamed (Editor) |
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ISBN: 3540232230 ISBN-13: 9783540232230 Publisher: Springer OUR PRICE: $104.49 Product Type: Paperback - Other Formats Published: September 2004 |
| Additional Information |
| BISAC Categories: - Computers | Image Processing - Computers | Computer Science - Computers | Computer Vision & Pattern Recognition |
| Dewey: 004 |
| LCCN: 2004112583 |
| Series: Lecture Notes in Computer Science |
| Physical Information: 1.81" H x 6.14" W x 9.21" (2.77 lbs) 882 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: ICIAR 2004, the International Conference on Image Analysis and Recognition, was the ?rst ICIAR conference, and was held in Porto, Portugal. ICIAR will be organized annually, and will alternate between Europe and North America. ICIAR 2005 will take place in Toronto, Ontario, Canada. The idea of o?ering these conferences came as a result of discussion between researchers in Portugal and Canada to encourage collaboration and exchange, mainly between these two countries, but also with the open participation of other countries, addressing recent advances in theory, methodology and applications. The response to the call for papers for ICIAR 2004 was very positive. From 316 full papers submitted, 210 were accepted (97 oral presentations, and 113 - sters). The review process was carried out by the Program Committee members and other reviewers; all are experts in various image analysis and recognition areas. Each paper was reviewed by at least two reviewing parties. The high q- lity of the papers in these proceedings is attributed ?rst to the authors, and second to the quality of the reviews provided by the experts. We would like to thank the authors for responding to our call, and we wholeheartedly thank the reviewers for their excellent work in such a short amount of time. We are espe- ally indebted to the Program Committee for their e?orts that allowed us to set up this publication. We were very pleased to be able to include in the conference, Prof. Murat KuntfromtheSwissFederalInstituteofTechnology, andProf. Mario Figueiredo, oftheInstitutoSuperiorT ecnico, inPortugal. |