| Built-In Self-Test of Global Routing Resources in FPGAs Contributor(s): Yao, Jia (Author) |
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ISBN: 3843374953 ISBN-13: 9783843374958 Publisher: LAP Lambert Academic Publishing OUR PRICE: $50.27 Product Type: Paperback Published: January 2011 |
| Additional Information |
| BISAC Categories: - Computers | Hardware - General |
| Physical Information: 0.21" H x 6" W x 9" (0.31 lbs) 88 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: It is important to test programmable routing resources in Field Programmable Gate Arrays (FPGAs) because they take up the largest portion of configuration memory bits. In Virtex-4 FPGAs, routing resources account for over 80% of the configuration memory. Built-In Self-Test (BIST) is adopted to test the routing resources in FPGAs and overcomes issues residing in previously developed test approaches. Analysis and evaluations of developed BIST algorithm and configurations are provided. |