| Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization 2018 Edition Contributor(s): Brodusch, Nicolas (Author), DeMers, Hendrix (Author), Gauvin, Raynald (Author) |
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ISBN: 9811044325 ISBN-13: 9789811044328 Publisher: Springer OUR PRICE: $75.99 Product Type: Paperback Published: October 2017 |
| Additional Information |
| BISAC Categories: - Technology & Engineering | Materials Science - General - Science | Spectroscopy & Spectrum Analysis - Technology & Engineering | Nanotechnology & Mems |
| Dewey: 620.11 |
| Series: Springerbriefs in Applied Sciences and Technology |
| Physical Information: 0.33" H x 6.14" W x 9.21" (0.49 lbs) 137 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage |