| Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility 2006 Edition Contributor(s): Ben Dhia, Sonia (Editor), Ramdani, Mohamed (Editor), Sicard, Etienne (Editor) |
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ISBN: 0387266003 ISBN-13: 9780387266008 Publisher: Springer OUR PRICE: $161.49 Product Type: Hardcover - Other Formats Published: December 2005 Annotation: Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented. The companion CD-ROM includes software illustrating key aspects of the book and a collection of demo tools applicable to EMC analysis of ICs. |
| Additional Information |
| BISAC Categories: - Mathematics | Measurement - Science | Physics - General - Technology & Engineering | Lasers & Photonics |
| Dewey: 530.8 |
| LCCN: 2005934276 |
| Physical Information: 0.98" H x 6.14" W x 9.21" (1.49 lbs) 473 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented. |