| Cross-Talk Noise Immune VLSI Design Using Regular Layout Fabrics 2001 Edition Contributor(s): Brayton, Robert K. (Author), Sangiovanni-Vincentelli, Alberto L. (Author) |
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ISBN: 079237407X ISBN-13: 9780792374077 Publisher: Springer OUR PRICE: $104.49 Product Type: Hardcover - Other Formats Published: July 2001 Annotation: This book was motivated by the problems being faced with shrinking IC process feature sizes. It is well known that as process feature sizes shrink, a host of electrical problems such as cross-talk, electromigration, self-heat, etc. become important. Cross-talk is one of the major problems since it results in unpredictable design behavior. In particular, it can result in significant delay variation or signal integrity problems in a wire, depending on the state of its neighboring wire. Typical approaches to tackling the cross-talk problem attempt to fix the problem once it is created. This book introduces a framework for cross-talk-free IC design. The main foundation of the book is the use of a predetermined layout pattern on the IC, which we call a layout fabric'. The authors characterize this fabric and show how it yields cross-talk-immune designs. Two VLSI design flows are introduced which use the fabric concept. One flow is a minimally modified standard-cell based flow. The other flow uses a network of PLAs to implement the circuit. The authors also introduce wire removal' techniques which improve circuit wire ability and thereby reduce circuit area. The new concepts presented here will be of interest to IC designers and researchers. |
| Additional Information |
| BISAC Categories: - Computers | Logic Design - Computers | Cad-cam - Technology & Engineering | Electrical |
| Dewey: 620.004 |
| LCCN: 2001029777 |
| Physical Information: 0.52" H x 6.94" W x 9.08" (0.77 lbs) 112 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: This book was motivated by the problems being faced with shrinking IC process feature sizes. It is well known that as process feature sizes shrink, a host of electrical problems like cross-talk, electromigration, self-heat, etc. are becoming important. Cross-talk is one of the major problems since it results in unpredictable design behavior. In particular, it can result in significant delay variation or signal integrity problems in a wire, depending on the state of its neighboring wires. Typical approaches to tackle the cross-talk problem attempt to fix the problem once it is created. In our approach, we ensure that cross-talk is eliminated by design. The work described in this book attempts to take an "outside-the-box" view and propose a radically different design style. This design style first imposes a fixed layout pattern (or fabric) on the integrated circuit, and then embeds the circuit being implemented into this fabric. The fabric is chosen carefully in order to eliminate the cross-talk problem being faced in modem IC processes. With our choice of fabric, cross-talk between adjacent wires on an IC is reduced by between one and two orders of magnitude. In this way, the fabric concept eliminates cross-talk up-front, and by design. We propose two separate design flows, each of which uses the fabric concept to implement logic. The first flow uses fabric-compliant standard cells as an im- plementation vehicle. We call these cells fabric cells, and they have the same logic functionality as existing standard cells with which they are compared. |