| Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard Softcover Repri Edition Contributor(s): Nicolici, Nicola (Author), Al-Hashimi, Bashir M. (Author) |
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ISBN: 1441953159 ISBN-13: 9781441953155 Publisher: Springer OUR PRICE: $104.49 Product Type: Paperback - Other Formats Published: December 2010 |
| Additional Information |
| BISAC Categories: - Computers | Logic Design - Medical - Technology & Engineering | Electrical |
| Dewey: 621.395 |
| Series: Frontiers in Electronic Testing |
| Physical Information: 0.41" H x 6.14" W x 9.21" (0.61 lbs) 178 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths. |