| Uncertainty Analysis For NIST Noise-Parameter Measurement Contributor(s): U. S. Department of Commerce (Author) |
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ISBN: 1494743973 ISBN-13: 9781494743970 Publisher: Createspace Independent Publishing Platform OUR PRICE: $15.19 Product Type: Paperback Published: January 2014 |
| Additional Information |
| BISAC Categories: - Reference |
| Physical Information: 0.07" H x 7.01" W x 10" (0.18 lbs) 36 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: Some time ago, what is now the Electromagnetics Division of the National Institute of Standards and Technology (NIST) developed the capability to measure noise parameters of amplifiers 1,2]. Recently, modified methods and analysis have been developed and have been applied both to amplifiers 3] and to transistors 4], the latter in an on-wafer environment. For such measurements to be meaningful, the results must be accompanied by corresponding uncertainties. |