| Noncontact Atomic Force Microscopy 2002 Edition Contributor(s): Morita, S. (Editor), Wiesendanger, Roland (Editor), Meyer, E. (Editor) |
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ISBN: 3540431179 ISBN-13: 9783540431176 Publisher: Springer OUR PRICE: $208.99 Product Type: Hardcover - Other Formats Published: July 2002 Annotation: Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues. |
| Additional Information |
| BISAC Categories: - Mathematics | Measurement - Technology & Engineering | Materials Science - Thin Films, Surfaces & Interfaces - Technology & Engineering | Nanotechnology & Mems |
| Dewey: 530.8 |
| LCCN: 2002021665 |
| Series: Nanoscience and Technology |
| Physical Information: 0.88" H x 6.4" W x 9.48" (1.69 lbs) 440 pages |