| Pattern Recognition with Support Vector Machines: First International Workshop, Svm 2002, Niagara Falls, Canada, August 10, 2002. Proceedings 2002 Edition Contributor(s): Lee, Seong-Whan (Editor), Verri, Alessandro (Editor) |
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ISBN: 354044016X ISBN-13: 9783540440161 Publisher: Springer OUR PRICE: $52.24 Product Type: Paperback - Other Formats Published: July 2002 Annotation: This book constitutes the refereed proceedings of the First International Workshop on Pattern Recognition with Support Vector Machines, SVM 2002, held in Niagara Falls, Canada in August 2002. The 16 revised full papers and 14 poster papers presented together with two invited contributions were carefully reviewed and selected from 57 full paper submissions. The papers presented span the whole range of topics in pattern recognition with support vector machines from computational theories to implementations and applications. |
| Additional Information |
| BISAC Categories: - Computers | Optical Data Processing - Computers | Computer Vision & Pattern Recognition - Computers | Computer Science |
| Dewey: 006.4 |
| LCCN: 2002026906 |
| Series: Lecture Notes in Computer Science |
| Physical Information: 0.68" H x 6.22" W x 9.3" (1.39 lbs) 428 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: With their introduction in 1995, Support Vector Machines (SVMs) marked the beginningofanewerainthelearningfromexamplesparadigm.Rootedinthe Statistical Learning Theory developed by Vladimir Vapnik at AT&T, SVMs quickly gained attention from the pattern recognition community due to a n- beroftheoreticalandcomputationalmerits.Theseinclude, forexample, the simple geometrical interpretation of the margin, uniqueness of the solution, s- tistical robustness of the loss function, modularity of the kernel function, and over't control through the choice of a single regularization parameter. Like all really good and far reaching ideas, SVMs raised a number of - terestingproblemsforboththeoreticiansandpractitioners.Newapproachesto Statistical Learning Theory are under development and new and more e?cient methods for computing SVM with a large number of examples are being studied. Being interested in the development of trainable systems ourselves, we decided to organize an international workshop as a satellite event of the 16th Inter- tional Conference on Pattern Recognition emphasizing the practical impact and relevance of SVMs for pattern recognition. By March 2002, a total of 57 full papers had been submitted from 21 co- tries.Toensurethehighqualityofworkshopandproceedings, theprogramc- mitteeselectedandaccepted30ofthemafterathoroughreviewprocess.Ofthese papers16werepresentedin4oralsessionsand14inapostersession.Thepapers span a variety of topics in pattern recognition with SVMs from computational theoriestotheirimplementations.Inadditiontotheseexcellentpresentations, there were two invited papers by Sayan Mukherjee, MIT and Yoshua Bengio, University of Montreal. |