| Design for Manufacturability and Yield for Nano-Scale CMOS Contributor(s): Chiang, Charles (Author), Kawa, Jamil (Author) |
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ISBN: 9048173035 ISBN-13: 9789048173037 Publisher: Springer OUR PRICE: $104.49 Product Type: Paperback - Other Formats Published: November 2010 |
| Additional Information |
| BISAC Categories: - Computers | Systems Architecture - General - Computers | Software Development & Engineering - General - Computers | Cad-cam |
| Dewey: 004.1 |
| Series: Integrated Circuits and Systems |
| Physical Information: 0.6" H x 6.14" W x 9.21" (0.90 lbs) 255 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a SOC design flow and addresses a new topic (DFM/DFY) critical at 90 nm and beyond. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development. |