Advanced Mathematical and Computational Tools in Metrology IV Contributor(s): Ciarlini, Patrizia (Editor), Pavese, Franco (Editor), Richter, Caparica D. (Editor) |
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ISBN: 9810242166 ISBN-13: 9789810242169 Publisher: World Scientific Publishing Company OUR PRICE: $139.65 Product Type: Hardcover - Other Formats Published: January 2000 Annotation: Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, are likely to benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in industrial processes. This book is of interest to people in universities, research centers and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and to those developing such mathematical tools. |
Additional Information |
BISAC Categories: - Mathematics | Measurement - Mathematics | Applied - Mathematics | Discrete Mathematics |
Dewey: 530.801 |
LCCN: 99-89211 |
Series: Advances in Mathematics for Applied Sciences |
Physical Information: 336 pages |
Descriptions, Reviews, Etc. |
Publisher Description: Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, are likely to benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in industrial processes.This book is of interest to people in universities, research centers and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and to those developing such mathematical tools. |