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VLSI Design and Test: 21st International Symposium, Vdat 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers 2017 Edition
Contributor(s): Kaushik, Brajesh Kumar (Editor), Dasgupta, Sudeb (Editor), Singh, Virendra (Editor)
ISBN: 9811074690     ISBN-13: 9789811074691
Publisher: Springer
OUR PRICE:   $104.49  
Product Type: Paperback
Published: December 2017
Qty:
Additional Information
BISAC Categories:
- Computers | Hardware - General
- Computers | Computer Science
- Computers | Operating Systems - General
Dewey: 004
Series: Communications in Computer and Information Science
Physical Information: 1.67" H x 6.14" W x 9.21" (2.54 lbs) 815 pages
 
Descriptions, Reviews, Etc.
Publisher Description:

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.