VLSI Design and Test: 21st International Symposium, Vdat 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers 2017 Edition Contributor(s): Kaushik, Brajesh Kumar (Editor), Dasgupta, Sudeb (Editor), Singh, Virendra (Editor) |
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ISBN: 9811074690 ISBN-13: 9789811074691 Publisher: Springer OUR PRICE: $104.49 Product Type: Paperback Published: December 2017 |
Additional Information |
BISAC Categories: - Computers | Hardware - General - Computers | Computer Science - Computers | Operating Systems - General |
Dewey: 004 |
Series: Communications in Computer and Information Science |
Physical Information: 1.67" H x 6.14" W x 9.21" (2.54 lbs) 815 pages |
Descriptions, Reviews, Etc. |
Publisher Description: This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. |