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Metric in Measure Spaces
Contributor(s): Yeh, James J. (Author)
ISBN: 9813200405     ISBN-13: 9789813200401
Publisher: World Scientific Publishing Company
OUR PRICE:   $55.10  
Product Type: Paperback - Other Formats
Published: January 2020
Qty:
Additional Information
BISAC Categories:
- Mathematics | Measurement
- Mathematics | Mathematical Analysis
- Mathematics | Reference
Physical Information: 0.65" H x 6" W x 9" (0.91 lbs) 308 pages
 
Descriptions, Reviews, Etc.
Publisher Description:

Measure and metric are two fundamental concepts in measuring the size of a mathematical object. Yet there has been no systematic investigation of this relation. The book closes this gap.


Contents: Measure and Outer Measure; Construction of Outer Measures; Borel Measures; Hausdorff Measures; Covering Theorems; Differentiation of Measures; Averaging Operators and Differentiation of Integrals; Lebesgue Differentiation Theorem for Integrals; Hardy-Littlewood Maximal Functions; Density of Sets; Approximate Limit and Approximate Continuity; Lipschitz Mappings;

Readership: Mathematicians and graduate students in mathematics.