| Statistical Regression with Measurement Error: Kendall's Library of Statistics 6 Contributor(s): Cheng, Chi-Lun (Author), Van Ness, John W. (Author) |
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ISBN: 047071106X ISBN-13: 9780470711064 Publisher: Wiley OUR PRICE: $87.35 Product Type: Hardcover Published: June 2010 |
| Additional Information |
| BISAC Categories: - Mathematics | Probability & Statistics - Regression Analysis |
| Dewey: 519.536 |
| Physical Information: 0.69" H x 6.14" W x 9.21" (1.26 lbs) 282 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: Providing a general survey of the theory of measurement error models, including the functional, structural, and ultrastructural models, this book is written in the of the Kendall and Stuart Advanced Theory of Statistics set and, like that series, includes exercises at the end of the chapters. The goal is to emphasize the ideas and practical implications of the theory in a style that does not concentrate on the theorem-proof format. |