| VLSI Test Principles and Architectures: Design for Testability Contributor(s): Wang, Laung-Terng (Author), Wu, Cheng-Wen (Author), Wen, Xiaoqing (Author) |
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ISBN: 1493300865 ISBN-13: 9781493300860 Publisher: Morgan Kaufmann Publishers OUR PRICE: $85.45 Product Type: Paperback - Other Formats Published: July 2006 |
| Additional Information |
| BISAC Categories: - Computers | Systems Architecture - General - Technology & Engineering | Electrical - Technology & Engineering | Electronics - Circuits - Vlsi & Ulsi |
| Dewey: 621.395 |
| Physical Information: 808 pages |
| Descriptions, Reviews, Etc. |
| Publisher Description: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. . Most up-to-date coverage of design for testability. . Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. . Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. . Lecture slides and exercise solutions for all chapters are now available. . Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website." |