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Title Author / Artist Prod Type ISBN/ISBN-13
or UPC		 Pub
Date		 Price
VLSI Test Principles and Architectures: Design for TestabilityWang, Laung-TerngPaperback1493300865 /
9781493300860		07/2006$85.45
VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))Wang, Laung-TerngHardcover0123705975 /
9780123705976		06/2006$85.45
  (2 items found)